Wafer Map Defect Pattern Classification and Image Retrieval

https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8263132

IEEE Xplore Full-Text PDF:

 

논문 리뷰 

https://bo971011-record.tistory.com/6

 

 

논문을 보고 실제 수행하기 위해 캐글에서 Wafer Map 데이터가 있는지 찾아보았다. 

 

 

https://www.kaggle.com/datasets/qingyi/wm811k-wafer-map

WM-811K wafer map

 

 

https://github.com/Junliangwangdhu/WaferMap

GitHub - Junliangwangdhu/WaferMap

 

또 다른 데이터셋 

 

https://github.com/PanithanS/Wafers-Defect-Recognition-using-Visual-Transformer

GitHub - PanithanS/Wafers-Defect-Recognition-using-Visual-Transformer: We use MixedWM38, the mixed-type wafer defect pattern dat

 

ViT를 이용해서 Wafer defect pattern recognition 코드도 볼 수 있었다. 

 

다 공부해보자. 

 

CNN Pytorch 

 

https://www.kaggle.com/code/woohyoni/wafermap-error-pattern-cnn-classification-pytorch

wafermap error pattern CNN Classification Pytorch

 

 

image_retrieval_with_WM811K

https://www.kaggle.com/code/makkimaki04/image-retrieval-with-wm811k

image_retrieval_with_WM811K

 

이거 꼭 수행하기

https://www.kaggle.com/code/orzlala/wafer-map-recognition

Wafer_Map_Recognition